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Ao. Prof. Dr. Jürgen Smoliner

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Review articles

Scanning Probe Techniques and Electronic Transport in Nanostructures

Scanning Probe Techniques like Atomic Force Microscopy (AFM) , Scanning Tunneling Microscopy  (STM) and related methods are  essential tools to investigate both topographic and electronic properties of semiconductor nanostructures.

The basic systems we are investigating are  GaAs-AlGaAs heterostructures, GaAs nanostructures and Si-devices using a STM and AFM related methods like Ballistic Electron Emission Microscopy (BEEM), Scanning Capacitance Microscopy (SCM). and most recently, Scanning Photocurrent Spectroscopy.  As typical example, a SCM image of a npn-transistor is shown above, where the differently colored areas represent different levels of doping.

Most recent activities happen in the field of spin effects in semiconductor heherostructures. (Rashba Effects in InGaAs-GaAsSb heterostructures).