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Ao. Prof. Dr. Jürgen Smoliner


Group members

Books and review articles

Electrons in Nanostructures and Scanning Probe Techniques

Scanning Probe Techniques like Atomic Force Microscopy (AFM) , Scanning Tunneling Microscopy  (STM) and related methods are  essential tools to investigate both topographic and electronic properties of semiconductor nanostructures.

The  systems we are investigating are  GaAs-AlGaAs heterostructures, GaAs anf Germanuum nanostructures and Si-devices using conventional low temperature transport,  Ballistic Electron Emission Microscopy (BEEM), Scanning Capacitance Microscopy (SCM). and most recently, Scanning Photocurrent Spectroscopy.  As typical example, a cross sectional SCM image of a npn-transistor is shown above, where the differently colored areas represent different levels of doping.

For details please see our publications.